Invited speakers

1. Advanced imaging with aberration-corrected TEM and STEM

• Angus Kirkland (Oxford University, UK)
• Stephen J. Pennycook (University of Tennessee, USA)
• Yimei Zhu (BNL, USA)
• Joachim Mayer (Ernst Ruska Center, Germany)
• Jianwei Miao (UCLA, USA)
• Joanne Etheridge (Monash University, Australia)
• Scott D. Findlay (Monash University, Australia)

2. Phase and field imaging including holography, 4D-STEM, and DPC-STEM

• Rafal Dunin-Borkowski (Ernst Ruska Center, Germany)
• Tsukasa Hirayama (JFCC, Japan)
• Naoya Shibata (University of Tokyo, Japan)
• Yasukazu Murakami (Kyushu University, Japan)
• Kenji Tsuda (Tohoku University, Japan)
• Colin Ophus (LBNL, USA)

3. Advanced spectroscopy including EELS and EDS

• Xiaoqing Pan (UC Irvin, USA)
• Kazu Suenaga (Osaka University, Japan)
• Masashi Watanabe (Leigh University, USA)
• Quentin Ramasse (SuperSTEM, UK)
• Juan Carlos Idrobo (University of Washington, USA)
• Wu Zhou (University of Chinese Academy of Science, China)
• Peng Gao (Peking University, China)
• Andrew Yankovich (Chalmers University of Technology, Sweden)

4. In-situ and environmental TEM and STEM

• Eva Olsson (Chalmers University of Technology, Sweden)
• Robert Sinclair (Stanford University, USA)
• Wolfgang Jaeger (Kiel University, Germany)
• Eric Stach (Univ. Pennsylvania, USA)
• Haimei Zheng (LBNL, USA)
• Zonghoon Lee (UNIST, Korea)
• Sang Ho Oh (KENTECH, Korea)

5. Advanced characterization of functional nanomaterials and devices

• Gerhard Dehm (MPIE Düsseldorf, Germany)
• Peter Crozier (Arizona State University, USA)
• Koji Kimoto (NIMS, Japan)
• Kazuto Arakawa (Shimane University, Japan)
• Xiuliang Ma (Shenyang National Laboratory, China)
• Gu Lin (Tsinghua University, China)
• Si-Young Choi (POSTECH, Korea)
• Ryo Ishikawa (University of Tokyo, Japan)